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Airborne Network Flight Test Recorder
TTC nREC-7000
Curtiss-Wright Defense Solutions
The nREC-7000 is a high speed network recorder for use with Flight Test Data Acquisition and Multiplexing units. The nREC-7000 accepts data for recording on two 10GBASE-SR ports and two 1000BASE-T ports that can store data at sustained speeds of up to 1,000 MBps per 10GbE port. The recorder is also capable of acquiring, formatting (using PCAP, DARv3 or IRIG-106 Chapter 10/11), and recording 10GBASE-SR Ethernet at line rate.
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Multimedia Test Video Generator/Analyzer
882EA-DP
The Teledyne LeCroy quantumdata 882EA-DP test instrument with both a DisplayPort 1.1 transmitter and receiver (analyzer) option is packed with features for video and audio testing of DisplayPort monitors and sources at pixel rates up to 268 MHz. The 882EA-DP test instrument provides two (2) additional DisplayPort ports for passive monitoring of the link layer through the optional Aux Channel Analyzer (ACA) application. The ACA option enables you to monitor link training transactions either betwe...show more -
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Quad Optical Loss Test Set
KI27624-INGAAS-APC
A Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber with an APC connector at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it provides a powerful solution to improve test flexibility and productivity.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Test Set
TS® 25D
This feature-rich test set is a necessity for a variety of installs. The TS25D Test Set features data lockout and lockout override, making you completely safe in talk or monitor mode. The DSL/POTS filtering technology allows you to safely draw dial tone without downing DSL.
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Count Down Test System
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.
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Altitude Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
The altitude test chambers of Sanwood Technology is designed to allow users to perform temperature, humidity, and altitude condition tests in a combined test chamber, and create multiple conditions to meet multiple test requirements at the same time.
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Vehicle Test Systems
What counts in development processes is the speed at which new vehicles and new technologies are made ready to go into production. For vehicle testing, this means that complex test problems must be solved. HORIBA develops vehicle test stands that simulate the realities of driving in the most varied situations both precisely and economically.
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Concrete Test Hammers
Test hammers are used to determine the surface hardness of concrete and are one of the most widely used instruments to assess concrete compressive strength. It is the quickest, simplest and least expensive method to obtain an estimate of the quality and strength of the concrete. Test Hammers with both analogue and digital displays are available.
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Digital Electronic Tensile Test Machine
Shenzhen Chuangxin Instruments Co., Ltd.
The Tensile Testing Machine is widely applied to test the tensile, tear, peel, and bend of all kinds of materials, such as metal, cable and etc, it’s used to test the tensile, tear, peel, compressive strength and bending of the material. It conforms to the standard of GB, ISO7500/1, JJG475-88, ASTME4, DIN5122, JISB7721/B7733, EN1002-2, BS1610, and CNS9471/9470.
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K-Base Test Board Adapter
1180
The TESCO K-Base Test Board Adapter allow quick, convenient testing of self-contained K-Base meters on test boards designed for socket type meters. The K-Base Test Board Adapters are designed for single phase (Catalog No. 1180-2) and polyphase (Catalog No. 1180-4).
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Test Valva Score
AI
Test Value Score is a revolutionary AI-powered feature that dynamically assigns a score to each test according to the contribution it provides to the testing process. The Test Value Score allows Test Managers to optimize their testing operation under time constraints and budget limitations.
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Three Phase Meter Test Bench
Supreme Instrument Laboratories
Three phase meter test bench suitable for calibration & testing of AC Ammeters, Voltmeters, Single phase Energy Meters, Watt Meters, Power Factor Meters, Three Phase Two Wire & Three Phase Four Wire Energy Meters Trivector Meters, Maximum demand indicators, of active & reactive systems, Three phase 3 wire & 4 wire watt meters, Var Meters, Power Factor Meters etc.
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Personal Workstations for Load Ranges up to 440 lbs.
9200 Series
The 9200 Series Vibration Isolation Workstation is a smaller, more compact design providing affordable personal convenience. The 9200 is ideal for applications such as Balances, Optical Microscopes, Cell Injection, Roundness Checkers, and Surface Profilometers.
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Test Automation Services
One of the effective approaches we are constantly using is keyword-driven testing (KDT). This approach covers hundreds of test cases in long-term projects with complex business logic.
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Digital Functional Test
CTS100i
Capable of performance testing to defined traceable standards, CTS100i is designed to test Military, Aerospace and Safety-Critical equipment. CTS100i is a cost-effective digital functional test system, available in single, dual and three bay versions.
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General Purpose Functional Test Systems
Keysight Technologies’ TS-5000 Family of Electronics Functional Test Systems offers a wealth of choices in general purpose instruments, power supplies, switch loading and DIO capabilities in a multiple rack heights, seamlessly connected with open architecture software Test Exec SL, all immaculately assembled and thoroughly tested so you don’t have to.
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Shore Durometer Test Stand
UI-FT31
Shore Durometer Test Stand is used to support the durometer presser foot surface parallel to the sample support table to better complete the test.
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CAM/TRAC Test Kits
Series 40
The CT Series 40 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance.
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Thermal Cycling and Humidity-Freeze Test
King Design Industrial Co., Ltd.
*10.4" TFT LCD, touch-type Chinese/English display controller.*Temperature/humidity setting procedure, LCD curve display device (set to “curve display”).*Chinese/English/LCD operation/troubleshoot/guiding window.*State-of-the-art intelligent auto-dispatch “heat load value” coolant servo valve flowrate algorithm control.
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Wafer Test Solutions
Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
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Custom Test Systems
ATE Systems has developed a wide variety of custom test systems that integrate commercial test instruments and custom hardware, tied together with a test executive. Examples of the types of tests that have been incorporated include: S-parameters (gain, return loss, VSWR, etc), Noise figure, Power, Spectral response, Linearity, Voltage, Current, Switching speed and so on
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Acoustic Test Chambers
Small Device Test Chambers are used for >Basic sound level measurement of small products and equipment >Pre-compliance testing of small products and equipment >End of line manufacturing test on small products and equipment Small Device Test Chambers provide acoustic isolation from outside sounds and/or reduce the sounds from the device under test radiating into the host
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Conductor Damage Test Set
CD-2M
Is designed to carry out tests specified for Switches used for Domestic and similar applications as included under IS:3854:1997. It is used to ensure that Screwtype terminals of switches are such that they clamp the conductor without causing undue damage to the conductor strands. It is a compact and robust andequipment housed in a bench top enclosure. The CD-2M is motorized to allow easy operation. The Instrument is designed to meet the requirements of IS:3854:1997 and other related specifications.
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USB Power Delivery Test Equipment
The Packet-Master USB-PDA is a USB PD Analyser, for FSK and Baseband variants of Power Delivery.
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LED Test Production System
Lumere-LC
Evolusys Technologies Sdn. Bhd.
Lumere LC is a LED test and measurement system for various parameters of LED light. It is economical, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs.
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Environmental Test Chambers
Infinity Machine International Inc.
Environmental Test Chambers by Infinity Machine International Inc. - for applications such as hydrostatic test chamber for soles, thermal shock chambers, temperature and humidity test chambers, rainproof testers, UV light testing, and more.
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Massively Parallel Parametric Test System
P9001A
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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